YWafer Mapper RD8-WL
Wafer mapping device with robot transport, multifunctional 200x200mm, RD8 series wafer PL
The RD8 series wafer mapping device is designed to accommodate various wafer sizes and shapes with a maximum measurement area of 200×200mm. Basic measurements include photoluminescence, epitaxial film thickness, wafer warpage, transmittance and reflectance, backside illumination phosphor analysis, and wafer thickness measurement, and we also offer customized solutions to meet customer needs.
- Company：ワイ・システムズ
- Price：Other
